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Reliability modeling with computer and maintenance applications /

editors, Syouji Nakamura, Cun Hua Qian, Toshio Nakagawa.

Book Cover
Names: Nakamura, Syouji, | Qian, Cun Hua, | Nakagawa, Toshio,
Published: Singapore : World Scientific, [2017]
Topics: Reliability (Engineering) | Computer science.
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University of Illinois at Urbana-Champaign

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Location & Availability for: Reliability modeling with computer and m