Location & Availability for: Applied logistic regression

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Applied logistic regression /

David W. Hosmer, Jr., Stanley Lemeshow.

Book Cover
Main Author: Hosmer, David W.
Other Names: Lemeshow, Stanley
Published: New York : Wiley, c1989.
Series: Wiley series in probability and mathematical statistics. Applied probability and statistics,
Topics: Regression analysis | Regression Analysis
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Illinois Wesleyan University

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Location & Availability for: Applied logistic regression