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Design, analysis and test of logic circuits under uncertainty [electronic resource] /

Smita Krishnaswamy, Igor L. Markov, John P. Hayes.

Book Cover
Main Author: Krishnaswamy, Smita.
Other Names: Markov, Igor L. | Hayes, John P.
Published: Dordrecht ; Springer, c2013.
Series: Lecture notes in electrical engineering ; v.115.
Topics: Logic circuits - Design. | Logic circuits - Testing. | Uncertainty (Information theory) | COMPUTERS / Logic Design | TECHNOLOGY & ENGINEERING / Electronics / Circuits / Logic | TECHNOLOGY & ENGINEERING / Electronics / Circuits / VLSI & ULSI
Genres: Electronic books.
Online Access: SpringerLink Link to Design, analysis and test of logic circuits under uncertainty (access limited to Benedictine University patrons)
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Location & Availability for: Design, analysis and test of logic circu