Location & Availability for: From artefacts to atoms : the BIPM and t

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From artefacts to atoms : the BIPM and the search for ultimate measurement standards /

Terry Quinn.

Book Cover
Main Author: Quinn, T. J.
Published: Oxford ; New York : Oxford University Press, [2012]
Topics: Metric system. | International Bureau of Weights and Measures. | Metric system. | TECHNOLOGY & ENGINEERING - Measurement. | International Bureau of Weights and Measures.
Genres: Electronic books.
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Location & Availability for: From artefacts to atoms : the BIPM and t