Location & Availability for: Randomness testing of the advanced encry

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Randomness testing of the advanced encryption standard finalist candidates [microform] /

Juan Soto, Lawrence Bassham.

Book Cover
Main Author: Soto, Juan
Other Names: Bassham, Lawrence E.
Published: Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2000]
Series: NISTIR ; 6483
Topics: Data encryption (Computer science)
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Location & Availability for: Randomness testing of the advanced encry